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Microscopes - Scanning electron microscope REM

A scanning electron microscope (SEM) is an electron microscope in which an electron beam is passed (rastered) in a specific pattern over the object to be magnified and interactions of the electrons with the object are used to produce an image of the object. The images typically produced by a scanning electron microscope are images of the object’s surfaces and have a high depth of field. Scanning transmission electron microscopy (STEM) can also be performed, but this requires suitably equipped transmission electron microscopes or dedicated scanning transmission electron microscopes.

Microscopes - Scanning electron microscope REM

Description

A scanning electron microscope (SEM) is an electron microscope in which an electron beam is passed (rastered) in a specific pattern over the object to be magnified and interactions of the electrons with the object are used to produce an image of the object.
The…

A scanning electron microscope (SEM) is an electron microscope in which an electron beam is passed (rastered) in a specific…


Suppliers

The following suppliers offer Microscopes - Scanning electron microscope REM products.

  • Thermo Fisher Scientific GmbH
  • Leica Mikrosysteme Vertrieb GmbH
  • Nikon GmbH
  • Portmann Instruments AG
  • Ryf AG